Dear colleagues,
Apologies for cross-posting.
You are cordially invited to the Academy of Management Discoveries (AMD) showcase session for this year's Academy of Management meeting. This AMD session will focus on the goals and scope of the forthcoming AMD special issue on errors in organizations. You can find a more detailed call for papers for this special issue on the AMD site.
http://aom.org/uploadedFiles/Publications/AMD/AMD_Call_for_Papers.Errors%20in%20Organizations.pdf
We look forward to seeing you in Chicago.
**********************************************************************************
| Session Type: Meeting Program Session: 1024 | Submission: 19233 | Sponsor(s): (PUBS) Scheduled: Monday, Aug 13 2018 9:45AM - 11:15AM at Swissôtel Chicago in Lucerne I |
| |
| AMD Showcase Session: Errors in Organizations: Exploring New Frontiers, and Developing New Opportunities for Theory, Research and Impact AMD Showcase: Errors in Orgs | |
Presenter: John S Carroll, Massachusetts Institute of Technology
Presenter: Marlys K. Christianson, U. of Toronto
Presenter: Michael Frese, National U. of Singapore
Presenter: Zhike Lei, Pepperdine U.
Presenter: Eitan Naveh, Technion Israel Institute of Technology
Presenter: Timothy J. Vogus, Vanderbilt U.
The time is ripe to encourage research advances that meaningfully contribute to organizational science and practice as regards to understanding, effectively coping with, and learning from errors. This showcase session will focus on the goals and scope of the forthcoming AMD special issue and assist authors to develop empirical papers that specify the processes, mechanisms, and boundary conditions required to better understand various forms of errors and their consequences in organizations across contexts.
Timothy J. Vogus
Brownlee O. Currey, Jr., Professor of Management
Vanderbilt University | Owen Graduate School of Management
401 21st Avenue South
Nashville, TN 37203-2422
Phone: 615.343.8094
Fax: 615.343.7177
E-mail: timothy.vogus@owen.vanderbilt.edu
Visit my faculty web page
Follow me on Twitter
Follow me on ResearchGate